中惠科技有限公司 中惠科技有限公司
  • Image Analysis

    Image-Pro Platform

    • Image-Pro
    • Base Features
    • 2D Capture
    • 2D Measurements
    • 2D Automated Analysis
    • 3D Visualization Analysis
    • AutoQuant Deconvolution

    Image Analysis Solution

    • MA-Pro
      • Grain Size
      • Sphericity
      • Cast Iron
    • IMC Coverage
    • Cleanliness
    • CCL Resin Flow
    • Fiber Cross-Section

    Product Integration

    • Wafer Mapping & Inspection
    • Image Scanning System
    • Stage Conotrol System
    • Extend Depth Of Field
    • Defect Inspection
    • Image Measurement
    • Hardness Testing

    Packages for Image Analysis

    Image-Pro® AI
    Life Science

    Image-Pro® AI
    Materials Science

     

    2D Measure Module
    AI Deep Learning

    2D Measure Module
    Analysis Protocols

    Helpful

    • System Requirements
    • Supported File Formats
    • Version Comparison
  • Optoelectronics

    TOPCON Products

    • 2D Spectroradiometer (SR-5100 Series)
      • SR-5100 2D Spectroradiometer
      • SR-5000 2D Spectroradiometer
    • Spectroradiometer (SR Series)
      • SR-5A Spectroradiometer
      • SR-5AS Spectroradiometer
      • SR-5S Spectroradiometer
      • SR-5 Spectroradiometer
      • SR-UL2 Spectroradiometer
      • SR-NIR Near Infrared Spectroradiometer
    • Luminance Colorimeter (BM Series)
      • BM-7AC Luminance Colorimeter
      • BM-5AC Luminance Colorimeter
      • BM-9A Luminance Meter
    • 2D Luminance Colorimeter (UA Series)
      • UA-200A 2D Luminance Colorimeter
      • UA-10A Uniformity Analyzer
      • UA-20C Luminance & Chromaticity Uniformity Analyzer
      • UA-20Y Luminance Uniformity Analyzer
    • Luminance Colorimeter (RD Series)
      • RD-80SA Luminance Colorimeter
    • Illuminance Meter (IM Series)
      • IM-2D Illuminance Meter
      • IM-600/IM-600M Digital Illuminance Meter
    • Ultraviolet Meter (UVR Series)
      • UVR-T2 Industrial UV Checker
      • UVR-300 UV Radiometer
    • Topcon Calibration Service

    APACER Products

    • Spectroradiometer (Hand-held Type)
      • AL100 / AL110
      • AL250
    • Spectral Irradiance Meter (Hand-held Type)
      • Ai111
      • Ai30S
      • Ai101
      • Ai250
    • Automation Platform for Sprctorradiometer
  • Automation

    Prior Microscope Automation

    • Motorized Stages For Upright Microscopes
      • ProScan H101A Motorized Stages
      • ProScan H101F Motorized Stages
      • ProScan H105 Motorized 6" Travel Stage
      • ProScan H105F Motorized Flat Top 6" Travel Stage
      • ProScan H116 Motorized 8" Travel Stage
      • ProScan H116SPN Motorized 8" Travel Stage with Shuttle Chuck
      • ProScan HWL6AL12 Motorized 8" Travel Stage with Shuttle Chuck
      • ProScan H112 Motorized 12" Travel Stage
      • ProScan H138A Motorized Stage With 8 Slide Capacity
      • ProScan HT1111LC Hardness Testing Motorized Industrial Stage
      • OptiScan ES111 Motorized Stages
    • Motorized Stages For Inverted Microscopes
      • ProScan H117 Motorized Stage
      • ProScan HLD117 Linear Motor Ultra-precision Stage
      • OptiScan ES107 Economical Motorized Stage
    • Physiology Platforms
      •    ── XYZ Deck Physiology Platforms ──   
      • H189 High Precision XYZ Deck
      • HZ106KT1 High Precision XYZ Deck
      • HZ106KT1E High Precision XYZ Deck
      • ProScan HT11 Heavy Duty Motorized Stage
      • ZDP50 Microscope Translation Stage
      •    ── Z Deck Electrophysiology Platform ──   
      • Manual Z Deck Manual XY Stage
      • Motorized Z Deck XY Stepper Motor Stage
      • Encoded Motorized Z Deck
    • Robotic Sample Loaders
      • SL160 Robotic Slide Loader for Microscopy
      • PLW20 Robotic Well Plate Loader System
    • OpenStand® platform
      • OpenStand-V Inverted Microscopy Platform
      • OpenStand-L Large Format Microscopy Platform
      • OpenStand-U Upright Microscopy Platform
      • OpenStand-M Small Format Microscopy Platform

    Prior Imaging Components

    • Focus Mechanisms
      •    ── Piezo-driven Nanoscan ──    
      • NanoScan OP400 Piezo Objective Scanner
      • NanoScan OP800 Piezo Objective Scanner
      • NanoScan SP Piezo Z-Axis Stage
      • WP120A Single Axis Piezo Stage (12" Wafer)
      •     ── Focus Mechanisms ──    
      • FB201 Manual Focusing Block - 29mm
      • FB203 Motorized Focusing Mount - 38mm
      • FB204 / FB205 Stage Focusing Mount - 38mm
      • FB206 Stage Focusing Mount - 38mm
      • FB210 Motorized Focusing Mount - 50mm
      • FB212 Stage Focusing Mount - 50mm
      • PS3H122R Bolt-On Motorized Focus Drive
      • H275LMT Extended Travel Motorized Focus Tower
    • Laser Autofocus
      • PureFocus™850 Laser Autofocus System
    • Controllers & Joysticks
      • ProScan III Universal Multi-axis Controller
      • OptiScan III Affordable 3-Axis Controller
      • ES10ZE Single Axis Focus Controller
      • CS200 Series Joysticks
    • Filter Wheels, Turrets & Shutters
      • HF108 High-Speed 8 Position Filter Wheel
      • HF110 High-Speed 10 Position Filter Wheel
      • HF108IX3 8 Position Filter Wheel for IX3
      • HF6NTK 6 Position Motorized Turret Upgrade Kit for Nikon Ti2
      • HF202HT 25mm High Speed Shutters
    • Light Sources
      • L200 Fluorescence Microscope Illumination

    Queensgate Nanopositioning Devices

    • Nanopositioning Piezo Stages
      • NPS-X-15A/NPS-X-15B Low Profile Fast 20µm Stage
      • NPS-X-28C Titanium Ultra Fast 28µm Stage
      • NPS-Z-15A Ultra Low Drift 15µm Stage
      • SP Mini-500 Compact Sample Positioner
      • NPS-XY-100A
      • NPS-XY-100D
      • NPS-TG-7A Fast Tip Tilt
      • NanoScan OP400
      • NanoScan OP800
      • NanoScan SP Z Series
    • Precision Actuators & Translators
      • DPT-E Closed Loop Piezo Actuators
      • MTP Open Loop Piezo Actuators
      • NPS-Z-15L Ultra High Load Closed Loop 20μm Actuator
      • NPS-Z-500B Long Range 500μm Amplified Actuator
    • Nanosensors
      • NX Series Capacitive Sensors
      • NC Series Capacitive Sensors
    • Nanopositioning Control Electronics
      • NPC-D-5200 Digital Piezo Closed Loop Controller
      • NPC-D-6000 Series Digital Piezo Closed Loop Controller
    • Vacuum Compatible Products
      • DPT-E Closed Loop Piezo Actuators
      • NX Series Capacitive Sensors
      • NC Series Capacitive Sensors
      • NPS-XY-100A
      • NPS-XY-100D
      • NPS-Z-500B Long Range 500μm Amplified Actuator
      • WP120A Wafer Positioner / Scanner
    • Specialist Stages and OEM Solutions
      • NPS-XYP-250Q
      • NPS-Z-90Q
      • NPS2100-20/NPS2101
  • Microscopic

    Microscope Camera

    • Retiga CCD Family
      • MicroPublisher 6™ CCD Camera
      • Retiga R6 CCD camera
      • Retiga ELECTRO Cooled CCD camera
      • Retiga LUMO CCD camera
    • INFINITY Series Microscopy Camera
      • INFINITY 5 CMOS Microscopy Camera
      • INFINITY 8 CMOS Microscopy Camera
    • Photometrics Scientific Cameras
      • Kinetix sCMOS cameras
      • Prime 95B™ Back-illuminated sCMOS camera
      • Prime BSI™ Back-illuminated sCMOS camera
      • Prime BSI Express sCMOS camera
      • Iris Family sCMOS cameras
      • Retiga E Family Cooled & Low-Noise CMOS camera
      • Moment High Speed CMOS camera
    • MI-Cam CMOS Camera
      • MI-Cam 5 Pro 顯微鏡數位相機
      • MI-Cam 6 顯微鏡數位相機
      • MI-Cam 20 顯微鏡數位相機

    Optical Microscope

    • Evident Microscope
    • Nikon Microscope
    • Microscope Cleaning and Maintenance

    Micrometer/Reticles/Scales

    • Microscope Eyepiece Reticles
    • Stage Micrometers & Calibration
    • TEM Grids (Specimen Support Grids)
    • Precision Apertures
    • Optical Resolution Charts
    • Counting Chambers
    • Inspection Instruments & Magnified Scales
    • Film Cover Slips and Film Reticles
  • Contact
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  1. You are here:  
  2. 知識庫
  3. 清潔度分析標準規範

產品服務專線:04-27080265 / 台中
02-89924292 / 台北

International Standard Specification for Cleanliness Analysis

清潔度分析標準規範

業界常應用於金屬材料之金相分析相關國際標準規範與行業準則

 

| Image-Pro 影像分析軟體 | MA-Pro 金相分析軟體 | 金相材料分析應用介紹 | 金相分析相關國際標準規範 |

| 圖像分析的五大困境 | 人工智慧顯微鏡影像分析初學者指南 | 深度解析 AI 類神經網路在影像分析中的應用 |

 

 


 

清潔度分析
Cleanliness Analysis
ISO 16232 道路車輛 - 流體迴路部件的清潔度
Road vehicles — Cleanliness of components of fluid circuits
說明: 這是針對汽車零件清潔度的國際通用標準,涵蓋了各種污染物的萃取、分析與報告方法。
VDA 19.1 德國汽車工業協會(VDA) 汽車工業技術清潔度檢測 - 零件功能相關顆粒污染
Technical Cleanliness in the Automotive Industry - Particulate Contamination of Functionally Relevant Automotive Components
說明: 這是由德國汽車工業協會制定的標準,與ISO 16232相輔相成,提供更詳細的檢測與評估指引。
ISO 4406 液壓傳動 - 液體中的固體顆粒污染 - 使用粒徑分級代碼的表達方式
Hydraulic fluid power — Fluids — Method for coding the level of contamination by solid particles
說明: 這項標準定義了一種清潔度代碼系統,用來量化並表達流體中的固體顆粒污染等級。
ISO 4407 液壓傳動 - 液體污染 - 使用光學顯微鏡計數法測定顆粒污染
Hydraulic fluid power - Fluid contamination - Determination of particulate contamination by the counting method using an optical microscope
說明: 這項標準規範了使用光學顯微鏡來測量液壓油等流體中固體顆粒污染的方法。它主要用於離線分析,並能對顆粒的數量、尺寸與形狀進行手動或圖像分析計數,有助於評估流體的清潔度。
NS 1638 液壓系統零件的清潔度要求
Cleanliness requirements of parts used in Hydraulic systems
SAE AS4059 航空航天流體動力 — 液壓油清潔度分類
Aerospace Fluid Power - Cleanliness Classification for Hydraulic Fluids
GB/T 20082 液壓傳動 — 液體污染 — 採用光學顯微鏡測定顆粒污染度的方法
Hydraulic fluid power-Fluid contamination-Determination of particulate contamination by the counting method using an optical microscope
GB/T 14039 液壓傳動 — 油液 — 固體顆粒污染等級代號
Hydraulic fluid power--Fluids--Method for coding the level of contamination by solid particles
ISO 9276-6 粒度分析結果表示法 - 第6部分:顆粒形狀和形態的描述與定量表示法
Representation of results of particle size analysis - Part 6: Descriptive and quantitative representation of particle shape and morphology
說明: 該標準提供了一套規則和術語,用於描述和定量表示顆粒的形狀和形態。它旨在補充粒度分析,提供更全面的顆粒特性資訊,例如圓度、長寬比和不規則度,這些資訊對於理解顆粒在不同工業應用中的行為至關重要。
ISO 11218 航空 - 清潔度分級液壓油
Aerospace — Cleanliness classification for hydraulic fluids
ISO 12345 柴油發動機—燃油噴射設備的清潔度評估
Diesel engines — Cleanliness assessment of fuel injection equipment
ISO 14644-1 無塵室潔淨度等級、測試方法 潔淨室及相關受控環境 - 第1部分:空氣潔淨度分類
Cleanrooms and associated controlled environments - Part 1: Classification of air cleanliness by particle concentration
說明: 此標準提供了對潔淨室或潔淨區空氣中懸浮微粒濃度進行分類的規範。它定義了九個潔淨等級(ISO 1至ISO 9),並根據不同粒徑(如0.1 µm, 0.5 µm, 5 µm)的最大容許顆粒數量來進行分類。
ISO 14644-9 無塵室潔淨度等級、測試方法 潔淨室及相關受控環境 - 第9部分:表面潔淨度分類
Cleanrooms and associated controlled environments - Part 9: Classification of surface cleanliness by particle concentration
說明: 此標準用於根據固體表面的微粒濃度來建立表面潔淨度等級。它適用於各種受控環境,並提供方法來評估和分類設備或零件表面的微粒污染。
ISO 14952 航天系統—流體系統的表面清潔度 / 第6部分:精密清洗工藝
Space systems — Surface cleanliness of fluid systems — Part 6: Precision-cleaning processes
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