Stage Micrometers & Grids S-Series

 

The scale or grid is chrome deposited centrally on a glass disc mounted in a black anodised aluminium slide mount 76mm x 25mm x 1.5mm thick. The metal mount gives these stage micrometers greater durability than those of all glass construction. These products are supplied in a plastic case with foam insert.
Available in transmitted and reflected (incident) light versions. All transmitted light stage micrometers, except the s48 and s18, have a no.0 cover glass optically cemented over the image.
This range of stage micrometers do not have unique serial numbers, so technically are not traceable. Many quality inspectors require any calibration tools to have unequivocal traceability, so a stamped or engraved serial number, for this we have our ps range of calibration scales.

STAGE MICROMETER : S1,S2,S4 ,S8, S11, S12, S16, S22, S48
STAGE COUNTING GRID : S9,S10,S28 ,S29
STAGE MICROMETER GROUPED GRADUATIONS : S21
HSE/NPL MK III TEST SLIDE : S84
VIBRATION TEST SLIDE : S25
METRIC/IMPERIAL : S18,S20
REFLECTED LIGHT STAGE MICROMETER : S1R,S4R,S78
HALTON FINDER SLIDE : S30
ENGLAND FINDER SLIDE : S7
PARTICLE ANALYSIS TEST/CALIBRATION SLIDE : SG7

S1 STAGE MICROMETER, 10MM/0.1MM

Key Features

Transmitted light stage micrometer with 10mm scale subdivided into 0.1mm divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.005mm

Accuracy (overall): <0.002mm

Pattern

Description

Order code

S1

Micrometer Scale 10mm in 0.1mm divisions

02A00400

S1 with Graticules certificate

02A00400/GRA

S1 with UKAS certificate

02A00400/UKA

S1 with NPL certificate

02A00400/NPL

S10 STAGE COUNTING GRID, 0.05MM SQUARES

Key Features

Transmitted light stage slide with 10 x 10 grid of 0.05mm squares

Line width: 0.004mm

Accuracy (overall): <0.0015mm

Pattern

Description

Order code

S10

Counting Slide 0.05mm Squares

02A00406

S11 STAGE MICROMETER, 0.005INCH/0.0001INCH

Key Features

Transmitted light stage micrometer with 0.005″ scale subdivided into 0.0001″ divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x 25mm x 1.5mm thick.

Line width: 0.001mm

Accuracy (overall): <0.00005"

Pattern

Description

Order code

S11

Micrometer Scale 0.005inch in 0.0001inch divisions

02A00407

S11 with Graticules certificate

02A00407/GRA

S11 with UKAS certificate

02A00407/UKA

S11 with NPL certificate

02A00407/NPL

S12 STAGE MICROMETER, 0.1MM/0.002MM

Key Features

Transmitted light stage micrometer with 0.1mm scale subdivided into 0.002mm divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.001mm

Accuracy (overall): <0.001mm

Image of product showing locating ring with cross and enlarged central scale detail.

Pattern

Description

Order code

S12

Micrometer Scale 0.1mm in 0.002mm division

02A00408

S12 with Graticules certificate

02A00408/GRA

S12 with UKAS certificate

02A00408/UKA

S12 with NPL certificate

02A00408/NPL

S16 STAGE MICROMETER, CROSSED SCALES 1MM/0.01MM

Key Features

Transmitted light stage micrometer with crossed scales, each 1mm subdivided into 0.01mm divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.0015mm

Accuracy (overall): <0.001mm

Pattern

Description

Order code

S16

Crossed Micrometer Scales 1mm in 0.01mmdivisions.

02A00429

S16 with Graticules certificate

02A00429/GRA

S16 with UKAS certificate

02A00429/UKA

S16 with NPL certificate

02A00429/NPL

S18 GRADUATED DOUBLE MICROMETER METRIC/IMPERIAL 25MM & 1 INCH

Key Features

Graduated Double Scale 25mm and 1 inch Micrometer

Metric & Imperial stage micrometer with double graduated scale

For the calibration of measurement instruments across a wide range of magnifications

This graduated scale stage micrometer is suitable for low magnification, stereo inspection microscopes to higher magnification compound microscopes.

The double scale (metric & English), extends this flexibility further, suiting Quality Control Departments that serve all international markets

The mm and inch scales are centred on all glass slide 76mm x 25mm x 1.5mm thick.

Line width: 0.0025mm

Accuracy (overall): 0.002mm

Pattern

Description

Order code

S18

Graduated Double Micrometer Scale

25mm/0.5mm; 5mm/0.1mm; 1mm/0.01mm

1"/0.05"; 4/20" in 0.01"; 1/20 in 0.001"

02A00418

S18 with Graticules certificate

02A00418/GRA

S18 with UKAS certificate

02A00418/UKA

S18 with NPL certificate

02A00418/NPL

S1R REFLECTED LIGHT STAGE MICROMETER, 10MM/0.1MM

Key Features

Reflected light stage micrometer with 10mm scale subdivided into 0.1mm divisions

Line width: 0.005mm

Accuracy (overall): <0.002mm

Pattern

Description

Order code

S1R

Micrometer Scale 10mm in 0.1mm divisions for reflected light

02A00440

S1R with Graticules certificate

02A00440/GRA

S1R with UKAS certificate

02A00440/UKA

S1R with NPL certificate

02A00440/NPL

S2 STAGE MICROMETER, 5MM/0.05MM

Key Features

Transmitted light stage micrometer with 5mm scale subdivided into 0.05mm

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.005mm

Accuracy (overall): <0.0015mm

Pattern

Description

Order code

S2

Micrometer Scale 5mm in 0.05mm divisions

02A00401

S2 with Graticules certificate

02A00401/GRA

S2 with UKAS certificate

02A00401/UKA

S2 with NPL certificate

02A00401/NPL

S20 STAGE MICROMETER, METRIC/IMPERIAL 2MM/0.01MM, 0.1INCH/0.0005INCH

Key Features

Transmitted light stage micrometer with double scale 2mm scale subdivided into 0.01mm divisions and 0.1inch subdivided into 0.0005inch divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x 25mm x 1.5mm thick.

Line width: 0.002mm (+0.001mm)

Accuracy (overall): <0.0015mm

Pattern

Description

Order code

S20

Double Micrometer Scale 2mm/0.01mm &0.1inch/0.0005inch div

02A00409

S20 with Graticules certificate

02A00409/GRA

S20 with UKAS certificate

02A00409/UKA

S20 with NPL certificate

02A00409/NPL

S21 STAGE MICROMETER GROUPED GRADUATIONS, 5MM/0.5MM, 2MM/0.1MM, 0.2MM/0.01MM

Key Features

Transmitted light stage micrometer with grouped graduations 5mm total length in 0.5mm divisions, 2mm section is further divided into 0.1mm divisions and final 0.2mm has 0.01mm divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.0025mm

Accuracy (overall): <0.002mm

Pattern

Description

Order code

S21

Micrometer Scale 5mm/0.5mm, 2mm/0.1mm,0.2mm/0.01mm

02A00410

S21 with Graticules certificate

02A00410/GRA

S21 with UKAS certificate

02A00410/UKA

S21 with NPL certificate

02A00410/NPL

S22 STAGE MICROMETER, VERTICAL 2MM/0.01MM

Key Features

Transmitted light stage micrometer with vertical 2mm scale subdivided into 0.01mm divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x 25mm x 1.5mm thick.

Line width: 0.0025mm

Accuracy (overall): <0.0015mm

Pattern

Description

Order code

S22

Micrometer Scale 2mm in 0.01mm divisions

02A00411

S22 with Graticules certificate

02A00411/GRA

S22 with UKAS certificate

02A00411/UKA

S22 with NPL certificate

02A00411/NPL

S25 VIBRATION TEST SLIDE (FOE PPL DOT PATTERN)

Key Features

Pairs of dots of decreasing separation which appear to merge during vibration tests

Pattern

Description

Order code

S25

Foepple Dot Vibration Test Pattern

02A00412

S28 STAGE COUNTING GRID, 0.01MM SQUARES

Key Features

Transmitted light stage slide with 20 x 20 grid of 0.01mm squares

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.003mm

Accuracy (overall): <0.0015mm

Pattern

Description

Order code

S28

0.01mm grid / 0.2 x 0.2mm overall

02B00428

S29 STAGE COUNTING GRID, 0.01MM SQUARES

Key Features

Transmitted light stage slide with 1.5mm x 1.5mm grid of 0.01mm squares

Line width: 0.003mm

Accuracy (overall): <0.0015mm

Pattern

Description

Order code

S29

0.01mm grid / 1.5m x 1.5mm overall

02B00429

S30 HALTON FINDER SLIDE

Key Features

Identical pattern to the S7 England Finder but with a smaller area of 5mm x 5mm

Pattern

Description

Order code

S30

Halton Finder

02A00413

S4 STAGE MICROMETER, 0.1INCH/0.001INCH

Key Features

Transmitted light stage micrometer with 0.1″ scale subdivided into 0.001″ divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.002mm

Accuracy (overall): <0.0001"

Pattern

Description

Order code

S4

Micrometer Scale 0.1inch in 0.001inch divisions

02A00402

S4 with Graticules certificate

02A00402/GRA

S4 with UKAS certificate

02A00402/UKA

S4 with NPL certificate

02A00402/NPL

S48 STAGE MICROMETER WITHOUT COVER GLASS 1MM/0.01MM

Key Features

Transmitted light stage micrometer with 1mm scale subdivided into 0.01mm divisions, no cover glass fitted

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x 25mm x 1.5mm thick.

Line width: 0.0027mm

Accuracy (overall): <0.0015mm

Pattern

Description

Order code

S48

Micrometer Scale 1mm/0.01mm Divisions without coverglass.

02A00414

S48 with Graticules certificate

02A00414/GRA

S48 with UKAS certificate

02A00414/UKA

S48 with NPL certificate

02A00414/NPL

S4R REFLECTED LIGHT STAGE MICROMETER, 0.1INCH/0.001INCH

Key Features

Reflected light stage micrometer with 0.1″ scale subdivided into 0.001″ divisions

Line width: 0.002mm

Accuracy (overall): <0.0001"

Pattern

Description

Order code

S4R-NEW

Micrometer Scale 0.1inch in 0.001inch divisions for reflected light

02A00442

S4R with Graticules certificate

02A00442/GRA

S4R with UKAS certificate

02A00442/UKA

S4R with NPL certificate

02A00442/NPL

S7 ENGLAND FINDER SLIDE

Key Features

Unique slide for recording the position of areas of interest. 9045 findable locations, each uniquely indexed.

The England Finder is a glass microscope slide with a uniquely indexed grid pattern that allows individual areas of interest to be referenced.

All England Finders produced by Pyser-Optics over the last 40 years are identical. The purpose of the slide is to give microscopists an easy method of recording the position of a particular area of interest, so that the same position can be re-located at a later date, or by another person in another laboratory, or when using an England Finder in another microscope.

Pattern

Description

Order code

S7

England Finder

02A00403

The location of the positioning arrows is identical for all England Finder slides. The method of use is as follows: Mark a label on the left hand side of the specimen slide, indicating the orientation to be repeated. Locate any area of interest on the slide then, without moving the stage, replace the specimen slide with the England Finder, the feature of interest can then be identified and noted from the index pattern. The area of interest can then be relocated at any time using the reverse of this procedure.

S78 REFLECTED LIGHT STAGE MICROMETER, 1MM/0.01MM

Key Features

NEW HIGH DEFINITION VERSION

Reflected light stage micrometer with 1mm scale subdivided into 0.01mm divisions

The S78 has a new high definition image to improve calibration resolution and allow line centre or line edge calibrations.

Line width: 0.002mm (+0.001mm)

Accuracy (overall): <0.001mm

Pattern

Description

Order code

S78

Micrometer Scale 1mm Scale in 0.01mm Divisions (for reflected light)

02A00421

S78 with Graticules certificate

02A00421/GRA

S78 with UKAS certificate

02A00421/UKA

S78 with NPL certificate

02A00421/NPL

S8 STAGE MICROMETER, 1MM/0.01MM

Key Features

Transmitted light stage micrometer with 1mm scale subdivided into 0.01mm divisions

These stage reticles are intended for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same reticle in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centred on a glass disc mounted in a black anodised aluminium slide 76mm x25mm x 1.5mm thick.

Line width: 0.002mm

Accuracy (overall): <0.001mm

Pattern

Description

Order code

S8

Micrometer Scale 1mm in 0.01mm divisions

02A00404

S8 with Graticules certificate

02A00404/GRA

S8 with UKAS certificate

02A00404/UKA

S8 with NPL certificate

02A00404/NPL

S84 HSE/NPL MK III TEST SLIDE

Key Features

Phase contrast test slide for checking resolution of microscopes used for asbestos analysis. Fully certified

This test slide is made in the UK under license from the National Physical Laboratory. The purpose of the slide is to provide a standard means to check the performance of phase microscopes prior to the analysis of asbestos. The pattern consists of seven bands of twenty lines with widths ranging from 0.25 microns to 1.1 microns. This slide is the band 5 version where microscopes need to be able to fully view band 5 and partially view band 6.

Each slide is fully tested and approved by the Health & Safety Laboratory, and issued with a certificate.

S84 

HSE/NPL Test Slide for Phase Contrast Calibration in Asbestos Analysis

02F00490

HSE recommend that the S84 is re-tested every 3 years.

S9 STAGE COUNTING GRID, 0.1MM SQUARES

Key Features

Transmitted light stage slide with 10 x 10 grid of 0.1mm squares

Line width: 0.005mm

Accuracy (overall): <0.0015mm

Pattern

Description

Order code

S9

Counting Slide 0.1mm Squares

02A00405

SG7 PARTICLE ANALYSIS TEST/CALIBRATION SLIDE

     

Key Features

Microscope slide with 200 particles of various shapes and sizes.

Each of the 200 shapes is numbered so that comparison can be done with particles in the specimen, and the details logged and communicated. Is also a useful tool for calibration and operator training. The particle sizes range from 1197um2 to 42308um2.

For pattern size details click here.

Now available with Type Test report that gives size and area information of all 200 particle shapes, contact Email住址會使用灌水程式保護機制。你需要啟動Javascript才能觀看它 for more information.

Pattern

Description

Order code

SG7

Test slide for particle sizing

02A00422

Pyser-Optics have facilities to manufacture random and regular patterns for the calibration of particle sizing and counting systems. Typically these may comprise regular shaped features of different sizes so that the imaging software has known reference sizes to set it's calibration. Alternatively, they may have a field area populated with 'random' shaped and sized features. Contact us with your requirements.

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