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  • Image Analysis

    Image-Pro Platform

    • Image-Pro
    • Base Features
    • 2D Capture
    • 2D Measurements
    • 2D Automated Analysis
    • 3D Visualization Analysis
    • AutoQuant Deconvolution

    Image Analysis Solution

    • MA-Pro
      • Grain Size
      • Sphericity
      • Cast Iron
    • IMC Coverage
    • Cleanliness
    • CCL Resin Flow
    • Fiber Cross-Section

    Product Integration

    • Wafer Mapping & Inspection
    • Image Scanning System
    • Stage Conotrol System
    • Extend Depth Of Field
    • Defect Inspection
    • Image Measurement
    • Hardness Testing

    Packages for Image Analysis

    Image-Pro® AI New

    for Life Science

    Image-Pro® AI New

    for Materials

     

    2D-Measure Module New

    AI Deep Learning

    2D-Measure Module New

    Analysis Protocols

    Helpful

    • System Requirements
    • Supported File Formats
    • Version Comparison
  • Optoelectronics

    TOPCON Products

    • 2D Spectroradiometer (SR-5100 Series)
      • SR-5100 2D Spectroradiometer
      • SR-5000 2D Spectroradiometer
    • Spectroradiometer (SR Series)
      • SR-5A Spectroradiometer
      • SR-5AS Spectroradiometer
      • SR-5S Spectroradiometer
      • SR-5 Spectroradiometer
      • SR-UL2 Spectroradiometer
      • SR-NIR Near Infrared Spectroradiometer
    • Luminance Colorimeter (BM Series)
      • BM-7AC Luminance Colorimeter
      • BM-5AC Luminance Colorimeter
      • BM-9A Luminance Meter
    • 2D Luminance Colorimeter (UA Series)
      • UA-200A 2D Luminance Colorimeter
      • UA-10A Uniformity Analyzer
      • UA-20C Luminance & Chromaticity Uniformity Analyzer
      • UA-20Y Luminance Uniformity Analyzer
    • Luminance Colorimeter (RD Series)
      • RD-80SA Luminance Colorimeter
    • Illuminance Meter (IM Series)
      • IM-2D Illuminance Meter
      • IM-600/IM-600M Digital Illuminance Meter
    • Ultraviolet Meter (UVR Series)
      • UVR-T2 Industrial UV Checker
      • UVR-300 UV Radiometer
    • Topcon Calibration Service

    APACER Products

    • Spectroradiometer (Hand-held Type)
      • AL100 / AL110
      • AL250
    • Spectral Irradiance Meter (Hand-held Type)
      • Ai111
      • Ai30S
      • Ai101
      • Ai250
    • Automation Platform for Sprctorradiometer
  • Automation

    Prior Microscope Automation

    • Motorized Stages For Upright Microscopes
      • ProScan H101A Motorized Stages
      • ProScan H101F Motorized Stages
      • ProScan H105 Motorized 6" Travel Stage
      • ProScan H105F Motorized Flat Top 6" Travel Stage
      • ProScan H116 Motorized 8" Travel Stage
      • ProScan H116SPN Motorized 8" Travel Stage with Shuttle Chuck
      • ProScan HWL6AL12 Motorized 8" Travel Stage with Shuttle Chuck
      • ProScan H112 Motorized 12" Travel Stage
      • ProScan H138A Motorized Stage With 8 Slide Capacity
      • ProScan HT1111LC Hardness Testing Motorized Industrial Stage
      • OptiScan ES111 Motorized Stages
    • Motorized Stages For Inverted Microscopes
      • ProScan H117 Motorized Stage
      • ProScan HLD117 Linear Motor Ultra-precision Stage
      • OptiScan ES107 Economical Motorized Stage
    • Physiology Platforms
      •    ── XYZ Deck Physiology Platforms ──   
      • H189 High Precision XYZ Deck
      • HZ106KT1 High Precision XYZ Deck
      • HZ106KT1E High Precision XYZ Deck
      • ProScan HT11 Heavy Duty Motorized Stage
      • ZDP50 Microscope Translation Stage
      •    ── Z Deck Electrophysiology Platform ──   
      • Manual Z Deck Manual XY Stage
      • Motorized Z Deck XY Stepper Motor Stage
      • Encoded Motorized Z Deck
    • Robotic Sample Loaders
      • SL160 Robotic Slide Loader for Microscopy
      • PLW20 Robotic Well Plate Loader System
    • OpenStand® platform
      • OpenStand-V Inverted Microscopy Platform
      • OpenStand-L Large Format Microscopy Platform
      • OpenStand-U Upright Microscopy Platform
      • OpenStand-M Small Format Microscopy Platform

    Prior Imaging Components

    • Focus Mechanisms
      •    ── Piezo-driven Nanoscan ──    
      • NanoScan OP400 Piezo Objective Scanner
      • NanoScan OP800 Piezo Objective Scanner
      • NanoScan SP Piezo Z-Axis Stage
      • WP120A Single Axis Piezo Stage (12" Wafer)
      •     ── Focus Mechanisms ──    
      • FB201 Manual Focusing Block - 29mm
      • FB203 Motorized Focusing Mount - 38mm
      • FB204 / FB205 Stage Focusing Mount - 38mm
      • FB206 Stage Focusing Mount - 38mm
      • FB210 Motorized Focusing Mount - 50mm
      • FB212 Stage Focusing Mount - 50mm
      • PS3H122R Bolt-On Motorized Focus Drive
      • H275LMT Extended Travel Motorized Focus Tower
    • Laser Autofocus
      • PureFocus™850 Laser Autofocus System
    • Controllers & Joysticks
      • ProScan III Universal Multi-axis Controller
      • OptiScan III Affordable 3-Axis Controller
      • ES10ZE Single Axis Focus Controller
      • CS200 Series Joysticks
    • Filter Wheels, Turrets & Shutters
      • HF108 High-Speed 8 Position Filter Wheel
      • HF110 High-Speed 10 Position Filter Wheel
      • HF108IX3 8 Position Filter Wheel for IX3
      • HF6NTK 6 Position Motorized Turret Upgrade Kit for Nikon Ti2
      • HF202HT 25mm High Speed Shutters
    • Light Sources
      • L200 Fluorescence Microscope Illumination

    Queensgate Nanopositioning Devices

    • Nanopositioning Piezo Stages
      • NPS-X-15A/NPS-X-15B Low Profile Fast 20µm Stage
      • NPS-X-28C Titanium Ultra Fast 28µm Stage
      • NPS-Z-15A Ultra Low Drift 15µm Stage
      • SP Mini-500 Compact Sample Positioner
      • NPS-XY-100A
      • NPS-XY-100D
      • NPS-TG-7A Fast Tip Tilt
      • NanoScan OP400
      • NanoScan OP800
      • NanoScan SP Z Series
    • Precision Actuators & Translators
      • DPT-E Closed Loop Piezo Actuators
      • MTP Open Loop Piezo Actuators
      • NPS-Z-15L Ultra High Load Closed Loop 20μm Actuator
      • NPS-Z-500B Long Range 500μm Amplified Actuator
    • Nanosensors
      • NX Series Capacitive Sensors
      • NC Series Capacitive Sensors
    • Nanopositioning Control Electronics
      • NPC-D-5200 Digital Piezo Closed Loop Controller
      • NPC-D-6000 Series Digital Piezo Closed Loop Controller
    • Vacuum Compatible Products
      • DPT-E Closed Loop Piezo Actuators
      • NX Series Capacitive Sensors
      • NC Series Capacitive Sensors
      • NPS-XY-100A
      • NPS-XY-100D
      • NPS-Z-500B Long Range 500μm Amplified Actuator
      • WP120A Wafer Positioner / Scanner
    • Specialist Stages and OEM Solutions
      • NPS-XYP-250Q
      • NPS-Z-90Q
      • NPS2100-20/NPS2101
  • Microscopic

    Microscope Camera

    • Retiga CCD Family
      • MicroPublisher 6™ CCD Camera
      • Retiga R6 CCD camera
      • Retiga ELECTRO Cooled CCD camera
      • Retiga LUMO CCD camera
    • INFINITY Series Microscopy Camera
      • INFINITY 5 CMOS Microscopy Camera
      • INFINITY 8 CMOS Microscopy Camera
    • Photometrics Scientific Cameras
      • Kinetix sCMOS cameras
      • Prime 95B™ Back-illuminated sCMOS camera
      • Prime BSI™ Back-illuminated sCMOS camera
      • Prime BSI Express sCMOS camera
      • Iris Family sCMOS cameras
      • Retiga E Family Cooled & Low-Noise CMOS camera
      • Moment High Speed CMOS camera
    • MI-Cam CMOS Camera

    Optical Microscope

    • Evident Microscope
    • Nikon Microscope
    • Microscope Cleaning and Maintenance

    Micrometer/Reticles/Scales

    • Microscope Eyepiece Reticles
    • Stage Micrometers & Calibration
    • TEM Grids (Specimen Support Grids)
    • Precision Apertures
    • Optical Resolution Charts
    • Counting Chambers
    • Inspection Instruments & Magnified Scales
    • Film Cover Slips and Film Reticles
  • Contact

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  2. Image Analysis Solution
Grain Size | MA-Pro Metallography Analysis | Image Analysis Solution

Grain Size 晶粒大小分析

適用於各種金屬材料與非金屬材料的粒徑量化分析

Grain Size 晶粒大小分析

The Best Image Analysis Solution for Grain Size Analysis

晶粒大小分析封面圖

Grain Size 晶粒大小分析系統專為 金屬與非金屬材料的晶粒度量測 而設計,符合 ASTM E 112、E1382、IS 4748 等國際標準,可用於 鋼鐵、鋁合金、鈦合金、多晶矽太陽能板 等材料的晶粒尺寸評估與品質控制。

本系統提供 多種量測模式,如圓形、對角線、水平線、垂直線等方法,並能自動偵測晶粒邊界,精準計算晶粒度號數 (Grain Size Distribution)。同時,支援 自訂量測區塊,讓使用者可針對特定區域進行分析,提高測試的靈活性與準確度。

透過 快速量測、自動統計,系統可大幅減少分析時間,並一鍵匯出至 Excel 報表,讓生產與品管流程更加高效。Grain Size 分析系統是材料科學、金相分析、品質檢驗等領域的理想選擇!

產品應用簡介

 

晶粒大小分析 (Grain Size Analysis)

Grain Size量測主要採用 ASTM E 112 定義 Standard Test Methods for Determining Average Grain Size,適用於各種金屬材料與非金屬材料的粒徑量化分析。

同心圓截點偵測
交叉線截點偵測

多晶矽太陽能板Grain Size量測範例

太陽能版晶粒大小量測

軟體功能

 

國際規範標準

可選擇 ASTM E 112-96 Standard Test Methods for Determining Average Grain Size、E1382、IS 4748等來分析標準晶粒度號數。

金相刻劃片

晶粒度號數示意圖

Graticules-Optics金相刻畫片

 

多種量測模式

提供圓形、對角線、水平線、重直線多種線段量測。自動偵測晶粒邊界,快速的量測並計算出晶粒度號數(Grain Size Distribution)。

多種量測模式

 

自訂量測區塊

可在影像上設定需要量測區塊,能夠量測需要範圍內的晶粒度號數。

區塊量測

 

快速操作、自動統計

快速量測、自動統計、一鍵匯出報表,減少分析時間並提升生產量。量測結果可匯出至Excel報表。

快速操作

 

銷售實績

(實際成交客戶名單持續增加中,若不願公布公司名稱,請來信告知)

 

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學術研究單位:中山科學研究院、漢翔、交通大學、中華科技大學、建國科技大學、勤益科技大學、高苑科技大學、義守大學、新竹標檢局、空軍三指部、軍備局、SGS、金屬中心。

如果您對 金相分析軟體 有興趣,歡迎隨時來電洽詢,我們有專業的技術團隊可以提供您滿意的軟體客製化服務。

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